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Conference contributions
Characterization of hot-carrier aging of a 0.35µm fully overlapped-LDD CMOS technology
Publication:
Characterization of hot-carrier aging of a 0.35µm fully overlapped-LDD CMOS technology
Date
1995
Proceedings Paper
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641.pdf
630.37 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Habas, Predrag
;
Bellens, Rudi
;
Groeseneken, Guido
;
Van den bosch, G.
;
Deferm, Ludo
Journal
Abstract
Description
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Views
1999
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1999
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations