Publication:

Carrier lifetime studies in diode structures on Si substrates with and without Ge doping

Date

 
dc.contributor.authorUleckas, A.
dc.contributor.authorGaubas, E.
dc.contributor.authorRafi, J.M.
dc.contributor.authorChen, J.
dc.contributor.authorYang, D.
dc.contributor.authorOhyama, H.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorVanhellemont, J.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-19T19:58:50Z
dc.date.available2021-10-19T19:58:50Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.issn1662-9779
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19926
dc.source.beginpage347
dc.source.endpage352
dc.source.journalSolid State Phenomena
dc.source.volume178-179
dc.title

Carrier lifetime studies in diode structures on Si substrates with and without Ge doping

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
23060.pdf
Size:
939.41 KB
Format:
Adobe Portable Document Format
Publication available in collections: