Publication:
Time dependent anomalous charge loss modeling in flash memories and an accelerated testing procedure
Date
| dc.contributor.author | Schuler, Franz | |
| dc.contributor.author | Tempel, Georg | |
| dc.contributor.author | Melzner, H. | |
| dc.contributor.author | Hendrickx, Paul | |
| dc.contributor.author | Wellekens, Dirk | |
| dc.contributor.author | Lorenzini, Martino | |
| dc.contributor.author | Van Houdt, Jan | |
| dc.contributor.imecauthor | Hendrickx, Paul | |
| dc.contributor.imecauthor | Wellekens, Dirk | |
| dc.contributor.imecauthor | Van Houdt, Jan | |
| dc.contributor.orcidimec | Van Houdt, Jan::0000-0003-1381-6925 | |
| dc.date.accessioned | 2021-10-14T17:46:55Z | |
| dc.date.available | 2021-10-14T17:46:55Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5639 | |
| dc.source.beginpage | 536 | |
| dc.source.conference | Extended Abstracts of the 2001 International Conference on Solid State Devices and Materials - SSDM | |
| dc.source.conferencelocation | Tokyo Japan | |
| dc.source.endpage | 537 | |
| dc.title | Time dependent anomalous charge loss modeling in flash memories and an accelerated testing procedure | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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