Publication:
Proton-induced mobility degradation in FinFETs with stressor layers and strained SOI substrates
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1935 since deposited on 2021-10-18
1last month
Acq. date: 2026-01-27
Citations
Statistics
Views
1935 since deposited on 2021-10-18
1last month
Acq. date: 2026-01-27
Citations