Publication:

Towards understanding hole traps and NBTI of Ge/GeO2/Al2O3 structure

Date

2013
Journal article
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Author(s)

Ma, J
;
Zhang, J.F.
;
Ji, Z.
;
Benbakhti, B.
;
Duan, M.
;
Zhang, W.
;
Zheng, X.F.
;
Mitard, Jerome  
;
Kaczer, Ben  
;
Groeseneken, Guido  
;
Hall, S.
;
Robertson, J.
;
Chalker, P.

Journal

Microelectronic Engineering

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