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Direct imaging of 3D atomic-scale dopant-defect clustering processes in ion-implanted silicon
Publication:
Direct imaging of 3D atomic-scale dopant-defect clustering processes in ion-implanted silicon
Date
2013
Journal article
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27893.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Koelling, Sebastian
;
Richard, Olivier
;
Bender, Hugo
;
Uematsu, M.
;
Schulze, Andreas
;
Zschaetzsch, Gerd
;
Gilbert, Matthieu
;
Vandervorst, Wilfried
Journal
Nano Letters
Abstract
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1926
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations
Metrics
Views
1926
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations