Publication:
Impact of stressors in future SiGe-based FinFETs: mobility boost and scalability
Date
| dc.contributor.author | Eneman, Geert | |
| dc.contributor.author | Brunco, David | |
| dc.contributor.author | Witters, Liesbeth | |
| dc.contributor.author | Mitard, Jerome | |
| dc.contributor.author | Hikavyy, Andriy | |
| dc.contributor.author | De Keersgieter, An | |
| dc.contributor.author | Roussel, Philippe | |
| dc.contributor.author | Loo, Roger | |
| dc.contributor.author | Veloso, Anabela | |
| dc.contributor.author | Horiguchi, Naoto | |
| dc.contributor.author | Collaert, Nadine | |
| dc.contributor.author | Thean, Aaron | |
| dc.contributor.imecauthor | Eneman, Geert | |
| dc.contributor.imecauthor | Witters, Liesbeth | |
| dc.contributor.imecauthor | Mitard, Jerome | |
| dc.contributor.imecauthor | Hikavyy, Andriy | |
| dc.contributor.imecauthor | De Keersgieter, An | |
| dc.contributor.imecauthor | Roussel, Philippe | |
| dc.contributor.imecauthor | Loo, Roger | |
| dc.contributor.imecauthor | Veloso, Anabela | |
| dc.contributor.imecauthor | Horiguchi, Naoto | |
| dc.contributor.imecauthor | Collaert, Nadine | |
| dc.contributor.imecauthor | Thean, Aaron | |
| dc.contributor.orcidimec | Eneman, Geert::0000-0002-5849-3384 | |
| dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
| dc.contributor.orcidimec | Hikavyy, Andriy::0000-0002-8201-075X | |
| dc.contributor.orcidimec | De Keersgieter, An::0000-0002-5527-8582 | |
| dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
| dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
| dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
| dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
| dc.date.accessioned | 2021-10-22T01:23:14Z | |
| dc.date.available | 2021-10-22T01:23:14Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2014 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23793 | |
| dc.identifier.url | http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6874646 | |
| dc.source.beginpage | 9 | |
| dc.source.conference | 7th International Silicon-Germanium Technology and Device Meeting - ISTDM | |
| dc.source.conferencedate | 2/06/2014 | |
| dc.source.conferencelocation | Singapore Singapore | |
| dc.source.endpage | 10 | |
| dc.title | Impact of stressors in future SiGe-based FinFETs: mobility boost and scalability | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |