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Characterisation of plasma etch releted residues formed on top of ECD Cu films
Publication:
Characterisation of plasma etch releted residues formed on top of ECD Cu films
Date
2000
Proceedings Paper
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4055.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Baklanov, Mikhaïl
;
Conard, Thierry
;
Lanckmans, Filip
;
Vanhaelemeersch, Serge
;
Holmes, D.
;
Maex, Karen
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1908
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1908
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations