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High performance pixel development for thin-film based image sensors

 
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0003-3738-4872
cris.virtual.orcid#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtualsource.departmentabfe18c0-25b9-4e7c-8082-60bfa1ba60e2
cris.virtualsource.department69a83b1b-e83f-42b4-afb5-5189331192f2
cris.virtualsource.orcidabfe18c0-25b9-4e7c-8082-60bfa1ba60e2
cris.virtualsource.orcid69a83b1b-e83f-42b4-afb5-5189331192f2
dc.contributor.authorLee, Jiwon
dc.contributor.authorJin, Minhyun
dc.date.accessioned2026-03-17T10:10:09Z
dc.date.available2026-03-17T10:10:09Z
dc.date.createdwos2025-10-23
dc.date.issued2025
dc.description.abstractThis paper presents a high-performance pixel design for thin film image sensors based on organic, colloidal quantum dot and perovskite photodiodes. The development of a simple yet effective pixel structure reduces pixel noise to enable high quality image sensors while maintaining high resolution, or adds functionality to enable global shutters or three-dimensional image sensors. Some representative examples of the pixel structures of the developed thin-film based image sensor are presented together with image demonstrations to show their effectiveness.
dc.identifier.doi10.1109/EDTM61175.2025.11040267
dc.identifier.isbn979-8-3315-0417-5
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/58857
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherIEEE
dc.source.conference9th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
dc.source.conferencedate2025-03-09
dc.source.conferencelocationHong Kong
dc.source.journal2025 9TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM
dc.source.numberofpages3
dc.title

High performance pixel development for thin-film based image sensors

dc.typeProceedings paper
dspace.entity.typePublication
imec.internal.crawledAt2025-10-22
imec.internal.sourcecrawler
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