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Conference contributions
Orientation imaging microscopy applications in Cu-interconnects and Cu-Cu wire bonding
Publication:
Orientation imaging microscopy applications in Cu-interconnects and Cu-Cu wire bonding
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Date
2002
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ratchev, Petar
;
Carbonell, Laure
;
Ho, Meng
;
Bender, Hugo
;
De Wolf, Ingrid
;
Verlinden, B.
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1909
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-09
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Metrics
Views
1909
since deposited on 2021-10-14
1
last month
Acq. date: 2025-12-09
Citations