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In-depth investigation of 0.13 μm SOI MOSFETs for high-temperature applications
Publication:
In-depth investigation of 0.13 μm SOI MOSFETs for high-temperature applications
Date
2004
Proceedings Paper
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10410.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kilchytska, V.
;
De Meyer, Kristin
;
Flandre, D.
Journal
Abstract
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since deposited on 2021-10-15
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Downloads
1
since deposited on 2021-10-15
Acq. date: 2025-10-25
Views
1874
since deposited on 2021-10-15
433
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations