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Sensitivity enhancement of metal oxide thin film transistor with back gate biasing

Date

2011
Proceedings Paper
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dc.contributor.authorDam, Van Anh
dc.contributor.authorBlauw, Michiel
dc.contributor.authorBrongersma, Sywert
dc.contributor.authorCrego Calama, Mercedes
dc.contributor.imecauthorDam, Van Anh
dc.contributor.imecauthorBrongersma, Sywert
dc.contributor.orcidimecBrongersma, Sywert::0000-0002-1755-3897
dc.date.accessioned2021-10-19T13:00:54Z
dc.date.available2021-10-19T13:00:54Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18763
dc.source.beginpage112
dc.source.conferenceEurosensors XXV
dc.source.conferencedate4/09/2011
dc.source.conferencelocationAthens Greece
dc.source.endpage115
dc.title

Sensitivity enhancement of metal oxide thin film transistor with back gate biasing

dc.typeProceedings paper
dspace.entity.typePublication
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