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Surface processes occurring on TiSi2 and CoSi2 in fluorine-based plasmas. Reactive ion etching in CF4/CHF3 plasmas
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Surface processes occurring on TiSi2 and CoSi2 in fluorine-based plasmas. Reactive ion etching in CF4/CHF3 plasmas
Date
1997
Journal article
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1691.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Baklanov, Mikhaïl
;
Vanhaelemeersch, Serge
;
Storm, Wolfgang
;
Kim, Young-Chang
;
Vandervorst, Wilfried
;
Maex, Karen
Journal
J. Vacuum Science and Technology A
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1971
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations
Metrics
Views
1971
since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations