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GeSn strain relaxation studies in view of SRB applications

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dc.contributor.authorWang, Wei
dc.contributor.authorShimura, Yosuke
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorLoo, Roger
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorLoo, Roger
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.accessioned2021-10-22T08:11:09Z
dc.date.available2021-10-22T08:11:09Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24806
dc.identifier.urlhttp://www.emrs-strasbourg.com/index.php?option=com_abstract&task=view&id=276&day=2014-09-15&year=2014&Itemid=&id_season=12
dc.source.beginpage1 2
dc.source.conferenceE-MRS Fall Symposium J: Alternative Semiconductor Integration in Si Microelectronics
dc.source.conferencedate15/09/2014
dc.source.conferencelocationWarsaw Poland
dc.title

GeSn strain relaxation studies in view of SRB applications

dc.typeMeeting abstract
dspace.entity.typePublication
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