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Conference contributions
Lifetime damage coefficients and low-frequency noise in MeV proton irradiated silicon diodes
Publication:
Lifetime damage coefficients and low-frequency noise in MeV proton irradiated silicon diodes
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Date
1997
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2121.pdf
65.69 KB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Claeys, Cor
;
Ohyama, Hidenori
;
Takami, Y.
;
Sunaga, H.
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1848
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Acq. date: 2025-12-16
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Metrics
Views
1848
since deposited on 2021-09-30
1
last month
Acq. date: 2025-12-16
Citations