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Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
Publication:
Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
Date
2020
Editorial Material
https://doi.org/10.1038/s41467-020-19053-9
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610.51 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lanza, Mario
;
Smets, Quentin
;
Huyghebaert, Cedric
;
Li, Lain-Jong
Journal
NATURE COMMUNICATIONS
Abstract
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259
since deposited on 2021-11-02
Acq. date: 2025-10-25
Views
1928
since deposited on 2021-11-02
Acq. date: 2025-10-25
Citations
Metrics
Downloads
259
since deposited on 2021-11-02
Acq. date: 2025-10-25
Views
1928
since deposited on 2021-11-02
Acq. date: 2025-10-25
Citations