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Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
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Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
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Date
2020
Editorial Material
https://doi.org/10.1038/s41467-020-19053-9
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lanza, Mario
;
Smets, Quentin
;
Huyghebaert, Cedric
;
Li, Lain-Jong
Journal
NATURE COMMUNICATIONS
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Downloads
275
since deposited on 2021-11-02
6
last month
Acq. date: 2025-12-11
Views
1932
since deposited on 2021-11-02
2
last month
Acq. date: 2025-12-11
Citations