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3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomography
Publication:
3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomography
Date
2013
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandervorst, Wilfried
;
Kambham, Ajay Kumar
;
Kumar, Arul
;
Gilbert, Matthieu
Journal
Ultramicroscopy
Abstract
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1953
since deposited on 2021-10-21
Acq. date: 2025-10-24
Citations
Metrics
Views
1953
since deposited on 2021-10-21
Acq. date: 2025-10-24
Citations