Publication:

Quantification of process-induced damage in highly-scaled pMTJ devices for MRAM applications

Date

2018

Proceedings Paper

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Author(s)

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Perumkunnil, Manu

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Souriau, Laurent

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Couet, Sebastien

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Tsvetanova, Diana

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Furnemont, Arnaud

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Kar, Gouri Sankar

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1960 since deposited on 2021-10-26

Acq. date: 2026-02-26