Publication:

Channel hot-carrier degradation in short-channel transistors with high-k/metal gate stacks

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1942 since deposited on 2021-10-17
Acq. date: 2025-10-23

Citations

Metrics

Views

1942 since deposited on 2021-10-17
Acq. date: 2025-10-23

Citations