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Channel hot-carrier degradation in short-channel transistors with high-k/metal gate stacks
Publication:
Channel hot-carrier degradation in short-channel transistors with high-k/metal gate stacks
Date
2009
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Amat, Esteve
;
Kauerauf, Thomas
;
Degraeve, Robin
;
De Keersgieter, An
;
Rodríguez, Rosana
;
Nafría, Montse
;
Aymerich, Xavier
;
Groeseneken, Guido
Journal
IEEE Transactions on Device and Materials Reliability
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1942
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1942
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations