Publication:
Paramagnetic point defects at interfacial layer in biaxial tensile strained (100)Si/SiO2
Date
| dc.contributor.author | Somers, P. | |
| dc.contributor.author | Stesmans, Andre | |
| dc.contributor.author | Afanas'ev, V.V. | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.imecauthor | Stesmans, Andre | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-17T10:54:54Z | |
| dc.date.available | 2021-10-17T10:54:54Z | |
| dc.date.issued | 2008 | |
| dc.identifier.issn | 0021-8979 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14497 | |
| dc.source.beginpage | 33703 | |
| dc.source.issue | 3 | |
| dc.source.journal | Journal of Applied Physics | |
| dc.source.volume | 103 | |
| dc.title | Paramagnetic point defects at interfacial layer in biaxial tensile strained (100)Si/SiO2 | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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