Publication:

III-V HBTs on 300 mm Si substrates using merged nano-ridges and its application in the study of impact of defects on DC and RF performance

Date

2022
Proceedings Paper
https://doi.org/10.1109/ESSDERC55479.2022.9947124
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dc.contributor.authorVais, Abhitosh
dc.contributor.authorYadav, Sachin
dc.contributor.authorMols, Yves
dc.contributor.authorVermeersch, Bjorn
dc.contributor.authorVondkar Kodandarama, Komal
dc.contributor.authorBaryshnikova, Marina
dc.contributor.authorMannaert, Geert
dc.contributor.authorAlcotte, Reynald
dc.contributor.authorBoccardi, Guillaume
dc.contributor.authorWambacq, Piet
dc.contributor.authorParvais, Bertrand
dc.contributor.authorLanger, Robert
dc.contributor.authorKunert, Bernardette
dc.contributor.authorCollaert, Nadine
dc.contributor.imecauthorVais, Abhitosh
dc.contributor.imecauthorYadav, Sachin
dc.contributor.imecauthorMols, Yves
dc.contributor.imecauthorVermeersch, Bjorn
dc.contributor.imecauthorVondkar Kodandarama, Komal
dc.contributor.imecauthorBaryshnikova, Marina
dc.contributor.imecauthorMannaert, Geert
dc.contributor.imecauthorAlcotte, Reynald
dc.contributor.imecauthorBoccardi, Guillaume
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorLanger, Robert
dc.contributor.imecauthorKunert, Bernardette
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecVais, Abhitosh::0000-0002-0317-7720
dc.contributor.orcidimecYadav, Sachin::0000-0003-4530-2603
dc.contributor.orcidimecMols, Yves::0000-0002-7072-0113
dc.contributor.orcidimecVermeersch, Bjorn::0000-0001-8640-672X
dc.contributor.orcidimecBaryshnikova, Marina::0000-0002-5945-4459
dc.contributor.orcidimecBoccardi, Guillaume::0000-0003-3226-4572
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecLanger, Robert::0000-0002-1132-3468
dc.contributor.orcidimecKunert, Bernardette::0000-0002-8986-4109
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecMannaert, Geert::0009-0003-1267-5355
dc.contributor.orcidimecAlcotte, Reynald::0009-0001-6529-0948
dc.date.accessioned2023-06-01T14:09:29Z
dc.date.available2023-02-09T03:20:55Z
dc.date.available2023-06-01T14:09:29Z
dc.date.issued2022
dc.description.wosFundingTextThe authors gratefully acknowledge the support of imec members from 300mm fab, III-V lab and the amsimec lab.
dc.identifier.doi10.1109/ESSDERC55479.2022.9947124
dc.identifier.eisbn978-1-6654-8497-8
dc.identifier.issn1930-8876
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41069
dc.publisherIEEE
dc.source.beginpage261
dc.source.conference52nd IEEE European Solid-State Device Research Conference (ESSDERC)
dc.source.conferencedateSEP 19-22, 2022
dc.source.conferencelocationMilan
dc.source.endpage264
dc.source.journalna
dc.source.numberofpages4
dc.title

III-V HBTs on 300 mm Si substrates using merged nano-ridges and its application in the study of impact of defects on DC and RF performance

dc.typeProceedings paper
dspace.entity.typePublication
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