Publication:

Properties of TiN thin films deposited by ALCVD as barriers for Cu metallization

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

2029 since deposited on 2021-10-14
Acq. date: 2025-12-08

Citations

Metrics

Views

2029 since deposited on 2021-10-14
Acq. date: 2025-12-08

Citations