Publication:
A Compact Physics Analytical Model for Hot-Carrier Degradation
Date
| dc.contributor.author | Tyaginov, Stanislav | |
| dc.contributor.author | Grill, Alexander | |
| dc.contributor.author | Vandemaele, Michiel | |
| dc.contributor.author | Grasser, Tibor | |
| dc.contributor.author | Hellings, Geert | |
| dc.contributor.author | Makarov, Alexander | |
| dc.contributor.author | Jech, Markus | |
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.imecauthor | Tyaginov, Stanislav | |
| dc.contributor.imecauthor | Grill, Alexander | |
| dc.contributor.imecauthor | Vandemaele, Michiel | |
| dc.contributor.imecauthor | Hellings, Geert | |
| dc.contributor.imecauthor | Linten, Dimitri | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Grill, Alexander::0000-0003-1615-1033 | |
| dc.contributor.orcidimec | Vandemaele, Michiel::0000-0003-0740-4115 | |
| dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2022-01-25T09:02:15Z | |
| dc.date.available | 2021-11-02T16:05:40Z | |
| dc.date.available | 2022-01-25T09:02:15Z | |
| dc.date.issued | 2020 | |
| dc.identifier.eisbn | 978-1-7281-3199-3 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38218 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | APR 28-MAY 30, 2020 | |
| dc.source.conferencelocation | Virtual | |
| dc.source.journal | na | |
| dc.source.numberofpages | 7 | |
| dc.title | A Compact Physics Analytical Model for Hot-Carrier Degradation | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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