Publication:

ESD performance of high mobility SiGe quantum well bulk FinFET diodes and pMOS devices

Date

2013
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorLinten, Dimitri
dc.contributor.authorHellings, Geert
dc.contributor.authorZografos, Odysseas
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorScholz, Mirko
dc.contributor.authorVeloso, Anabela
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorZografos, Odysseas
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecZografos, Odysseas::0000-0002-9998-8009
dc.date.accessioned2021-10-21T09:27:31Z
dc.date.available2021-10-21T09:27:31Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22706
dc.source.beginpage22
dc.source.conference35th Annual EOS/ESD Symposium
dc.source.conferencedate8/09/2013
dc.source.conferencelocationLas Vegas, NV USA
dc.source.endpage29
dc.title

ESD performance of high mobility SiGe quantum well bulk FinFET diodes and pMOS devices

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions