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The role of preamorphization and activation for ultra shallow junction formation on strained Si layers grown on SiGe buffer
Publication:
The role of preamorphization and activation for ultra shallow junction formation on strained Si layers grown on SiGe buffer
Date
2004
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pawlak, Bartek
;
Vandervorst, Wilfried
;
Lindsay, Richard
;
De Wolf, Ingrid
;
Roozeboom, F.
;
Delhougne, Romain
;
Benedetti, Alessandro
;
Loo, Roger
;
Caymax, Matty
;
Maex, Karen
;
Cowern, N.E.B.
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1873
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1873
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations