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Trends and perspectives for electrical characterization and reliability assessment in advanced CMOS technologies
Publication:
Trends and perspectives for electrical characterization and reliability assessment in advanced CMOS technologies
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Date
2010
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Groeseneken, Guido
;
Degraeve, Robin
;
Kaczer, Ben
;
Martens, Koen
Journal
Abstract
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1844
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Acq. date: 2025-12-15
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Metrics
Views
1844
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-15
Citations