Publication:

Intensity-energy response function of Al/Cr-Ka x-ray photoemission instruments: An inter-laboratory study

Date

2024
Journal article
https://doi.org/10.1016/j.elspec.2024.147486
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dc.contributor.authorAlamarguy, David
dc.contributor.authorAureau, Damien
dc.contributor.authorConard, Thierry
dc.contributor.authorGauthier, Nicolas
dc.contributor.authorGeorgi, Frederic
dc.contributor.authorGuilet, Stephane
dc.contributor.authorHajjar-Garreau, Samar
dc.contributor.authorHeintz, Olivier
dc.contributor.authorMonier, Guillaume
dc.contributor.authorMethivier, Christophe
dc.contributor.authorMontigaud, Herve
dc.contributor.authorSoule, Samantha
dc.contributor.authorRenault, Olivier
dc.contributor.authorLazzari, Remi
dc.contributor.imecauthorConard, Thierry
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.date.accessioned2025-03-24T15:28:28Z
dc.date.available2024-09-30T17:28:51Z
dc.date.available2025-03-24T15:28:28Z
dc.date.issued2024
dc.identifier.doi10.1016/j.elspec.2024.147486
dc.identifier.issn0368-2048
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44591
dc.publisherELSEVIER
dc.source.beginpageArt. 147486
dc.source.endpageN/A
dc.source.issueOctober
dc.source.journalJOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
dc.source.numberofpages13
dc.source.volume276
dc.subject.keywordsPHOTOELECTRON ANGULAR-DISTRIBUTION
dc.subject.keywordsFREE PATHS IMFPS
dc.subject.keywordsSURFACE EXCITATION PARAMETER
dc.subject.keywordsQUANTITATIVE-ANALYSIS
dc.subject.keywordsRANGE
dc.subject.keywordsSPECTRA
dc.subject.keywordsSOLIDS
dc.subject.keywordsXPS
dc.subject.keywordsPHOTOIONIZATION
dc.subject.keywordsQUANTIFICATION
dc.title

Intensity-energy response function of Al/Cr-Ka x-ray photoemission instruments: An inter-laboratory study

dc.typeJournal article
dspace.entity.typePublication
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