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A lock-in approach for photo-conductivity based lifetime measurement
Publication:
A lock-in approach for photo-conductivity based lifetime measurement
Date
2007-09
Proceedings Paper
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16111.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cornagliotti, Emanuele
;
Agostinelli, Guido
;
Beaucarne, Guy
;
Poortmans, Jef
Journal
Abstract
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1908
since deposited on 2021-10-16
Acq. date: 2025-10-24
Citations
Metrics
Views
1908
since deposited on 2021-10-16
Acq. date: 2025-10-24
Citations