Publication:
Stochastic modeling of hot-carrier degradation in nFinFETs considering the impact of random traps and random dopants
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1993 since deposited on 2021-10-27
1last month
Acq. date: 2026-05-16
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Statistics
Views
1993 since deposited on 2021-10-27
1last month
Acq. date: 2026-05-16
Citations