Publication:
Stochastic modeling of hot-carrier degradation in nFinFETs considering the impact of random traps and random dopants
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1989 since deposited on 2021-10-27
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Acq. date: 2026-01-09
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1989 since deposited on 2021-10-27
2last month
1last week
Acq. date: 2026-01-09
Citations