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Stochastic modeling of hot-carrier degradation in nFinFETs considering the impact of random traps and random dopants
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1986 since deposited on 2021-10-27
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Acq. date: 2025-10-24
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Views
1986 since deposited on 2021-10-27
452item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations