Publication:

Double patterning OPC and design for 22nm to 16nm device nodes

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1915 since deposited on 2021-10-18
Acq. date: 2025-10-23

Citations

Metrics

Views

1915 since deposited on 2021-10-18
Acq. date: 2025-10-23

Citations