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Improved channel length and series resistance extraction for short-channel MOSFETs suffering from mobility degradation
Publication:
Improved channel length and series resistance extraction for short-channel MOSFETs suffering from mobility degradation
Date
1997
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nicolett, A. S.
;
Martino, Joao Antonio
;
Simoen, Eddy
;
Claeys, Cor
Journal
Journal of Solid-State Devices and Circuits
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1895
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Acq. date: 2025-12-09
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Views
1895
since deposited on 2021-09-30
1
last month
1
last week
Acq. date: 2025-12-09
Citations