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Conference contributions
Modeling of in-plane distortions and overlay errors encountered during 3-D NAND flash device fabrication
Publication:
Modeling of in-plane distortions and overlay errors encountered during 3-D NAND flash device fabrication
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Date
2023
Proceedings Paper
https://doi.org/10.1109/EuroSimE56861.2023.10100780
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Okudur, Oguzhan Orkut
;
Gonzalez, Mario
;
Van den Bosch, Geert
;
Rosmeulen, Maarten
Journal
N/A
Abstract
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771
since deposited on 2023-10-17
1
last month
Acq. date: 2025-12-17
Citations
Metrics
Views
771
since deposited on 2023-10-17
1
last month
Acq. date: 2025-12-17
Citations