Publication:
Evaluation of the channel engineering impact on the analog performance of deep-submicron partially depleted SOI MOSFETs at low temperatures
Date
| dc.contributor.author | Hayama, K. | |
| dc.contributor.author | Ohyama, H. | |
| dc.contributor.author | Takakura, K. | |
| dc.contributor.author | Rafi, J.M. | |
| dc.contributor.author | Mercha, Abdelkarim | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Mercha, Abdelkarim | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Mercha, Abdelkarim::0000-0002-2174-6958 | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-15T13:43:28Z | |
| dc.date.available | 2021-10-15T13:43:28Z | |
| dc.date.issued | 2004 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9002 | |
| dc.source.beginpage | 21 | |
| dc.source.conference | Microelectronics Technology and Devices SBMICRO | |
| dc.source.conferencedate | 8/09/2004 | |
| dc.source.conferencelocation | Recife Brazil | |
| dc.source.endpage | 26 | |
| dc.title | Evaluation of the channel engineering impact on the analog performance of deep-submicron partially depleted SOI MOSFETs at low temperatures | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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