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Valence-band electron-tunneling measurement of the gate work function: application to the high-k / polycrystalline-silicon interface
Publication:
Valence-band electron-tunneling measurement of the gate work function: application to the high-k / polycrystalline-silicon interface
Date
2005
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pantisano, Luigi
;
Afanas'ev, Valeri
;
Pourtois, Geoffrey
;
Chen, Pei Jun
Journal
Journal of Applied Physics
Abstract
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2022
since deposited on 2021-10-16
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Acq. date: 2025-10-25
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Metrics
Views
2022
since deposited on 2021-10-16
415
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations