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Scaling effects in dual-bit split-gate nitride memory devices
Publication:
Scaling effects in dual-bit split-gate nitride memory devices
Date
2005
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Breuil, Laurent
;
Haspeslagh, Luc
;
Lorenzini, Martino
;
De Vos, Joeri
;
Van Houdt, Jan
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Abstract
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1927
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations
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Views
1927
since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations