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A perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformity
Publication:
A perturbative approach to predict eye diagram degradation in differential interconnects subject to asymmetry and nonuniformity
Date
2017
Proceedings Paper
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36546.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Manfredi, Paolo
;
Wu, Xinglong
;
Grassi, Flavia
;
Vande Ginste, Dries
;
Pignari, Sergio A.
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Abstract
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1853
since deposited on 2021-10-24
Acq. date: 2025-10-25
Citations
Metrics
Views
1853
since deposited on 2021-10-24
Acq. date: 2025-10-25
Citations