Publication:
Hole-trapping-related transients in shallow n+-p junctions fabricated in a high-energy boron-implanted p well
Date
| dc.contributor.author | Poyai, Amporn | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-14T17:37:33Z | |
| dc.date.available | 2021-10-14T17:37:33Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5585 | |
| dc.source.beginpage | 949 | |
| dc.source.endpage | 951 | |
| dc.source.issue | 7 | |
| dc.source.journal | Applied Physics Letters | |
| dc.source.volume | 78 | |
| dc.title | Hole-trapping-related transients in shallow n+-p junctions fabricated in a high-energy boron-implanted p well | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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