Publication:

Experimental validation of self-heating simulations in transistors in deeply scaled nodes

Date

2014
Proceedings Paper
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dc.contributor.authorBury, Erik
dc.contributor.authorKaczer, Ben
dc.contributor.authorRoussel, Philippe
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorRaleva, Katerina
dc.contributor.authorVasileska, Dragica
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.date.accessioned2021-10-22T00:51:00Z
dc.date.available2021-10-22T00:51:00Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23596
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6861186&contentType=Conference+Publications
dc.source.beginpageXT.8
dc.source.conferenceInternational Reliability Physics Symposium - IRPS
dc.source.conferencedate1/06/2014
dc.source.conferencelocationWaikoloa, HI USA
dc.title

Experimental validation of self-heating simulations in transistors in deeply scaled nodes

dc.typeProceedings paper
dspace.entity.typePublication
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