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Lithography as a critical step for low-k dual damascene: from 248nm to 193nm
Publication:
Lithography as a critical step for low-k dual damascene: from 248nm to 193nm
Date
2000
Proceedings Paper
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4706.pdf
281 KB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ronse, Kurt
;
Maenhoudt, Mireille
;
Pollentier, Ivan
;
Wiaux, Vincent
;
Struyf, Herbert
;
Lepage, Muriel
;
Vanhaelemeersch, Serge
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1918
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1918
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations