Publication:

3D-Atomprobe : facts, artifacts and applications in semiconductors

Date

2010
Proceedings Paper
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dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorKoelling, Sebastian
dc.contributor.authorGilbert, Matthieu
dc.contributor.authorKambham, Ajay Kumar
dc.contributor.imecauthorVandervorst, Wilfried
dc.date.accessioned2021-10-18T23:24:31Z
dc.date.available2021-10-18T23:24:31Z
dc.date.embargo9999-12-31
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18224
dc.source.conferenceThe International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions at Seikei University - SISS-12
dc.source.conferencedate10/06/2010
dc.source.conferencelocationTokyo Japan
dc.title

3D-Atomprobe : facts, artifacts and applications in semiconductors

dc.typeProceedings paper
dspace.entity.typePublication
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