Publication:

Evaluation of surface passivation layers for bulk lifetime estimation of high resistivity silicon for radiation detectors

Date

2008
Proceedings Paper
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dc.contributor.authorRafi, J.M.
dc.contributor.authorCardona-Safont, L.
dc.contributor.authorZabala, M.
dc.contributor.authorBoulord, C.
dc.contributor.authorCampabadal, F.
dc.contributor.authorPellegrini, G.
dc.contributor.authorLozano, M.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-17T10:03:25Z
dc.date.available2021-10-17T10:03:25Z
dc.date.embargo9999-12-31
dc.date.issued2008
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14352
dc.source.beginpage431
dc.source.conferenceGettering and Defect Engineering in Semiconductor Technology XII
dc.source.conferencedate14/10/2007
dc.source.conferencelocationErice Italy
dc.source.endpage436
dc.title

Evaluation of surface passivation layers for bulk lifetime estimation of high resistivity silicon for radiation detectors

dc.typeProceedings paper
dspace.entity.typePublication
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