Publication:

Imaging Algorithm and Optimal Measurement Protocol for 3-D Impedance Tomography on 2-D High-Density Microelectrode Array

 
dc.contributor.authorDeng, Jian
dc.contributor.authorRenders, Jens
dc.contributor.authorMeenaketan, Babu Linkoon
dc.contributor.authorEbrahimi Takalloo, Saeedeh
dc.contributor.authorBraeken, Dries
dc.contributor.authorDe Beenhouwer, Jan
dc.contributor.authorSijbers, Jan
dc.contributor.imecauthorDeng, Jian
dc.contributor.imecauthorRenders, Jens
dc.contributor.imecauthorBraeken, Dries
dc.contributor.imecauthorDe Beenhouwer, Jan
dc.contributor.imecauthorSijbers, Jan
dc.contributor.imecauthorMeenaketan, Babu Linkoon
dc.contributor.imecauthorEbrahimi Takalloo, Saeedeh
dc.contributor.orcidimecDeng, Jian::0000-0001-5106-1581
dc.contributor.orcidimecRenders, Jens::0000-0003-4327-7328
dc.contributor.orcidimecBraeken, Dries::0000-0002-5752-3203
dc.contributor.orcidimecDe Beenhouwer, Jan::0000-0001-5253-1274
dc.contributor.orcidimecSijbers, Jan::0000-0003-4225-2487
dc.contributor.orcidimecEbrahimi Takalloo, Saeedeh::0000-0003-3679-8125
dc.date.accessioned2024-11-06T08:58:40Z
dc.date.available2024-09-29T18:03:40Z
dc.date.available2024-11-06T08:58:40Z
dc.date.issued2024
dc.description.wosFundingTextThe work of Jens Renders was supported by the Research Foundation Flanders under Grant 1SA2920N.
dc.identifier.doi10.1109/JSEN.2024.3417289
dc.identifier.issn1530-437X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44586
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage24452
dc.source.endpage24465
dc.source.issue15
dc.source.journalIEEE SENSORS JOURNAL
dc.source.numberofpages14
dc.source.volume24
dc.subject.keywordsELECTRICAL-RESISTIVITY TOMOGRAPHY
dc.subject.keywordsMEMORY BFGS METHOD
dc.subject.keywordsCOMPUTATION
dc.title

Imaging Algorithm and Optimal Measurement Protocol for 3-D Impedance Tomography on 2-D High-Density Microelectrode Array

dc.typeJournal article
dspace.entity.typePublication
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