Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
New developments in charge pumping measurements on thin stacked dielectrics
Publication:
New developments in charge pumping measurements on thin stacked dielectrics
Copy permalink
Date
2008
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
17480.pdf
523.26 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Toledano-Luque, Maria
;
De Gendt, Stefan
;
Groeseneken, Guido
;
Zahid, Mohammed
;
Pantisano, Luigi
;
Degraeve, Robin
;
San Andres, Enrique
Journal
IEEE Transactions on Electron Devices
Abstract
Description
Metrics
Views
1954
since deposited on 2021-10-17
Acq. date: 2025-12-10
Citations
Metrics
Views
1954
since deposited on 2021-10-17
Acq. date: 2025-12-10
Citations