Publication:
Improved extraction of carrier concentration and depletion width from capacitance-voltage characteristics of silicon N(+)- P-well junction diodes
Date
| dc.contributor.author | Poyai, Amporn | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-14T22:51:05Z | |
| dc.date.available | 2021-10-14T22:51:05Z | |
| dc.date.issued | 2002 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6737 | |
| dc.source.beginpage | 1192 | |
| dc.source.endpage | 1194 | |
| dc.source.issue | 7 | |
| dc.source.journal | Applied Physics Letters | |
| dc.source.volume | 80 | |
| dc.title | Improved extraction of carrier concentration and depletion width from capacitance-voltage characteristics of silicon N(+)- P-well junction diodes | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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