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Ultra-low k dielectric and plasma damage control for advanced technology nodes (10-nm and below)
Publication:
Ultra-low k dielectric and plasma damage control for advanced technology nodes (10-nm and below)
Date
2013
Meeting abstract
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lazzarino, Frederic
;
Krishtab, Mikhail
;
Tahara, Shigeru
;
Baklanov, Mikhaïl
Journal
Abstract
Description
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2073
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations
Metrics
Views
2073
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations