Influence of Drain and Gate Potential on Gate Failure in Semi-Vertical GaN-on-Si Trench MOSFETs

Simple item page Full metadata Statistics

Author(s)

;

;

;

;

;

Bakeroot, Benoit

;

;

Decoutere, Stefaan

;

;

;

Journal

na

Metrics

1290 since deposited on 2023-02-27

Acq. date: 2025-10-23