Publication:

Influence of Drain and Gate Potential on Gate Failure in Semi-Vertical GaN-on-Si Trench MOSFETs

Date

2022

Proceedings Paper

https://doi.org/10.1109/IRPS48227.2022.9764600

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Author(s)

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Bakeroot, Benoit

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Decoutere, Stefaan

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Journal

na

Statistics

1292 since deposited on 2023-02-27

Acq. date: 2026-01-25