Publication:

Improved AC conductance and Gray-Brown methods to characterize fast and slow traps in Ge metal–oxide–semiconductor capacitors

Date

2012
Journal article
Simple item page Full metadata Statistics
 
dc.contributor.authorSun, Xiao
dc.contributor.authorMerckling, Clement
dc.contributor.authorBrammertz, Guy
dc.contributor.authorLin, Dennis
dc.contributor.authorDekoster, Johan
dc.contributor.authorCui, Sharin
dc.contributor.authorMa, T. P.
dc.contributor.imecauthorSun, Xiao
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorBrammertz, Guy
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorDekoster, Johan
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.contributor.orcidimecBrammertz, Guy::0000-0003-1404-7339
dc.date.accessioned2021-10-20T16:37:27Z
dc.date.available2021-10-20T16:37:27Z
dc.date.embargo9999-12-31
dc.date.issued2012
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21572
dc.source.beginpage54102
dc.source.issue5
dc.source.journalJournal of Applied Physics
dc.source.volume111
dc.title

Improved AC conductance and Gray-Brown methods to characterize fast and slow traps in Ge metal–oxide–semiconductor capacitors

dc.typeJournal article
dspace.entity.typePublication
Files

Original bundle

Name:
25855.pdf
Size:
1.14 MB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Articles