Publication:
3D IC analysis using magnetic field imaging
Date
| dc.contributor.author | Gaudestad, Jan | |
| dc.contributor.author | Orozco, A. | |
| dc.contributor.author | De Wolf, Ingrid | |
| dc.contributor.author | Jeffers, A. | |
| dc.contributor.author | Cheng, B. | |
| dc.contributor.author | Wellstood, F.C. | |
| dc.contributor.imecauthor | De Wolf, Ingrid | |
| dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
| dc.date.accessioned | 2021-10-21T07:45:51Z | |
| dc.date.available | 2021-10-21T07:45:51Z | |
| dc.date.issued | 2013 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22377 | |
| dc.source.conference | 33rd Annual Nano Testing symposium | |
| dc.source.conferencedate | 13/11/2013 | |
| dc.source.conferencelocation | Osaka Japan | |
| dc.title | 3D IC analysis using magnetic field imaging | |
| dc.type | Meeting abstract | |
| dspace.entity.type | Publication | |
| Files | ||
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