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On the origin of the 1/f1.7 noise in deep submicron partially depleted SOI transistors
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On the origin of the 1/f1.7 noise in deep submicron partially depleted SOI transistors
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Date
2002
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lukyanchikova, N.
;
Petrichuk, M.
;
Garbar, N.
;
Simoen, Eddy
;
Mercha, Abdelkarim
;
van Meer, Hans
;
De Meyer, Kristin
;
Claeys, Cor
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1931
since deposited on 2021-10-14
Acq. date: 2025-12-15
Citations
Metrics
Views
1931
since deposited on 2021-10-14
Acq. date: 2025-12-15
Citations