Publication:

Self-heating assesment of GaN DHFETs using mono-lithically fabricated 2-DEG resistors

Date

2010
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorSrivastava, Puneet
dc.contributor.authorDas, Jo
dc.contributor.authorOprins, Herman
dc.contributor.authorVan Hove, Marleen
dc.contributor.authorMarcon, Denis
dc.contributor.authorCheng, Kai
dc.contributor.authorLeys, Maarten
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorMertens, Robert
dc.contributor.authorBorghs, Gustaaf
dc.contributor.imecauthorOprins, Herman
dc.contributor.imecauthorMarcon, Denis
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.imecauthorMertens, Robert
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.orcidimecOprins, Herman::0000-0003-0680-4969
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2021-10-18T21:52:31Z
dc.date.available2021-10-18T21:52:31Z
dc.date.issued2010
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18026
dc.source.beginpage1
dc.source.conference34th European Workshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE
dc.source.conferencedate17/05/2010
dc.source.conferencelocationDarmstadt Germany
dc.source.endpage4
dc.title

Self-heating assesment of GaN DHFETs using mono-lithically fabricated 2-DEG resistors

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions